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This is a Non-Federal dataset covered by different Terms of Use than Data.gov.

Insulated-Gate Bipolar Transistor (IGBT) Accelerated Aging

Metadata Updated: February 22, 2025

Preliminary data from thermal overstress accelerated aging using the aging and characterization system. The data set contains aging data from 6 devices, one device aged with DC gate bias and the rest aged with a squared signal gate bias. Several variables are recorded and, in some cases, high-speed measurements of gate voltage, collector-emitter voltage, and collector current are available. The data set is provided by the NASA Prognostics Center of Excellence (PCoE).

Access & Use Information

Public: This dataset is intended for public access and use. Non-Federal: This dataset is covered by different Terms of Use than Data.gov. License: See this page for license information.

Downloads & Resources

Dates

Metadata Created Date February 22, 2025
Metadata Updated Date February 22, 2025

Metadata Source

Harvested from nasa test json

Additional Metadata

Resource Type Dataset
Metadata Created Date February 22, 2025
Metadata Updated Date February 22, 2025
Publisher PCoE
Maintainer
Identifier https://data.nasa.gov/api/views/7wwx-fk77
Data First Published 2022-11-22
Data Last Modified 2025-02-19
Category Raw Data
Public Access Level public
Bureau Code 026:00
Metadata Context https://project-open-data.cio.gov/v1.1/schema/catalog.jsonld
Schema Version https://project-open-data.cio.gov/v1.1/schema
Catalog Describedby https://project-open-data.cio.gov/v1.1/schema/catalog.json
Harvest Object Id e9303396-3a3f-4824-89f0-f6a60e127bb0
Harvest Source Id a73e0c30-4684-40ef-908e-d22e9e9e5f86
Harvest Source Title nasa test json
Homepage URL https://data.nasa.gov/d/7wwx-fk77
License https://www.usa.gov/government-works
Program Code 026:021
Source Datajson Identifier True
Source Hash 605788dc8b0f8bab15dc71ff9ee20d31a0ce53518262179df06e09ae05b85da1
Source Schema Version 1.1

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